Atomic Force Microscope designed for easy integration with Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques allows you to take advantage of both commonly used microscopy techniques.

Easy integration with Scanning Electron Microscopes
Atomic Force Microscope designed for easy integration with Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques allows you to take advantage of both commonly used microscopy techniques.
Complex sample analysis
The unique multidimensional correlative imaging technology allows the simultaneous acquisition of SEM and AFM data and their perfect correlation in 3D images.
In situ conditions
All measurements are made at the same time, in the same place and under the same conditions, avoiding the need to transfer samples and risk contamination during the analysis.
Precise location of the region of interest
Extremely accurate and time-saving approach using SEM to locate and navigate AFM to the region of interest.