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    Easy integration with Scanning Electron Microscopes

    Atomic Force Microscope designed for easy integration with Scanning Electron Microscopes. The combination of complementary AFM and SEM techniques allows you to take advantage of both commonly used microscopy techniques.

    Oxford Instruments
    The unique technology of Correlative Probe and Electron Microscopy (CPEM) allows the simultaneous acquisition and correlation of the chosen SEM and AFM channels

    Complex sample analysis

    The unique multidimensional correlative imaging technology allows the simultaneous acquisition of SEM and AFM data and their perfect correlation in 3D images.

    In situ conditions

    All measurements are made at the same time, in the same place and under the same conditions, avoiding the need to transfer samples and risk contamination during the analysis.

    Precise location of the region of interest

    Extremely accurate and time-saving approach using SEM to locate and navigate AFM to the region of interest.