FIB Dual Beam
The Scios 2 DualBeam System offers best-in-class performance in sample preparation, subsurface and 3D characterization for the widest range of samples.
The Thermo Scientifc ™ Scios ™ 2 DualBeam ™ system is an ultra-high resolution analytical system that offers excellent sample preparation and 3D characterization performance for the widest range of samples, including magnetic and non-conductive materials.
With innovative features designed to increase throughput, accuracy and ease of use, the Scios 2 DualBeam System is an ideal solution to meet the needs of scientists and engineers in advanced research and analysis in academic, government and industrial research environments.
Scientists and engineers are constantly facing new challenges that require highly localized characterization of increasingly complex samples with increasingly smaller resources.
The latest technological innovations in the Scios 2 DualBeam System, in combination with the most comprehensive and easy-to-use Thermo Scientific AutoTEM ™ 4 software and our application experience, allow for quick and easy preparation of site-specific HR-S / TEM Samples for a wide variety of materials.
In order to obtain high quality results, final polishing with low energy ions is necessary to minimize damage to the sample surface.
The Thermo Scientific Sidewinder ™ HT Focused Ion Beam (FIB) column not only offers high resolution images and high stress milling, but also performs well at low stress, allowing the creation of high quality TEM slides.
For more information, consult an Altmann specialist.