Epsilon 3X bench-top X-ray fluorescence spectrometer (EDXRF) for non-destructive elemental chemical analysis of Na to Am used in the control of industrial processes and in research and development.
Fluorescence Spectrometer
Epsilon 3X bench-top X-ray fluorescence spectrometer (EDXRF) for non-destructive elemental chemical analysis of Na to Am used in the control of industrial processes and in research and development.
This system has a ceramic tube, excitation capacity of 50kV and 1mA, including the latest silicon drift detection technology.
Epsilon 3 X is able to quickly and accurately analyze the most diverse materials, which can be liquids, solids, loose powders, glass, metals, sludge, filters, etc.
Concentrations at PPM levels at 100% of the element in the sample can be quantified.